Dear S/TEM enthusiasts!

The high resolution JEOL 2800 S/TEM with ultrafast EDS (twin high count detectors) has arrived!

This first-of-its kind in the Americas instrument is being assembled on site and is expected to be functional the first week of September. Monitor progress at the Surface Analysis Lab (SMBB room 2149).  We at the Nanofab are excited to see how this USTAR/MRSEC-funded instrument will make research at the U even better.  We will be hosting an applications open house once the instrument is running where we will evaluate any non-outgassing samples free of charge.

One of the challenges of this instrument is adequately prepared samples: samples are required to have a thickness of 100nm or less.  Synthesized nano particles are straightforward since they are already at the proper size scale, and can be easily attached to membranes, which you can obtain or we can supply.  Bulk sample preparation requires extensive thinning from time-consuming and low-yielding processes comprising either grinding techniques or FIB lift-out.  We have these tools in-house too, so come talk with us about your sample preparation needs and we can begin developing protocols.

Pricing for sample prep is a straight-up $20/sample encompassing the small tools smorgasbord style, and $84/hr + tech time for the FIB (on-campus rates).
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Note that this instrument IS available for use by for-profit entities, thanks to JEOL for paying the import duties.

Details on training will be coming out separately…

See you soon!

Randy, Paulo, Brian, Ian