In preparation for training to use the JEM-2800 S/TEM which will become available to us in the first week of September, we are recommending training as follows:
August TEM basic short courses on the JEM-1400 with Dr. David Belnap (HSC EM Core):
(this is the same UI and same sample handling as the JEM-2800)
Session 1
Basic TEM operations
Session 2
Focusing
Session 3 (usually after the user spends significant time practicing)
Alignments
Session 4
Other high-end functions depending on user’s preference: e.g. high-magnification imaging, low-dose imaging, diffraction, etc.
This course will cost $320 billable to a research project when the instrument time is shared between two students. Please contact Dr. David Belnap for scheduling details.
MET E 5240/6240Advanced S/TEM ($150 lab fee subsidized by the Nanofab and by Prof. Guruswamy)
We strongly suggest that anyone signing up for this class also arrange for their research project to pay for the August short course from David Belnap.
1-on-1 Training
There will be individualized training on an ongoing basis when the staff are convinced that the researcher has the background necessary to jump in to the technique. Otherwise we will request that students take a regimen of (above described) coursework just as we do when students request to train on the XPS.
Advanced Knobology:
If anyone is already familiar with S/TEM operation and just needs to understand the user interface, please contact SAL staff directly to arrange for training with JEOL technicians.
Sample Preparation: Please contact us if you need to begin developing a protocol for your specific samples
– Ion milling and dimpling sample preparation techniques are now available in the USTAR Surface Analysis lab at a price of $20/sample (smorgasbord pricing includes all techniques necessary for the per-sample price).
– FIB sample preparation seems to be the popular technique for STEM analysis currently, due to the ability to select exactly the location where the analysis is to be done, and so preserve the spatial context for the hi-resolution imaging. If you need to access FIB-lift-out techniques, we are planning to charge per-hour, at least until we get a better feel for how long these techniques take to prepare a sample. There is a large dependency of successful FIB lift-out yield on the nature of the sample itself. Pricing is estimated to be $400-500 per sample, based on estimated hourly usage for tool and driver. If you wish to train on the FIB, and you have 50 hrs of stick time on either the Quanta, the NovaNano or another FIB, please come see us.
Thank you,
Ian Harvey