The Surface Analysis lab is pleased to announce the addition of 3D imaging and elemental mapping tomography to its high resolution S/TEM, the JEM-2800.

Through a collaboration between the U, S/TEM manufacturer JEOL and developer App5, we add another first-of-its-kind among academic institutions: the ability to map elemental compositional distributions in 3D. This is done by reconstructing images taken during a tilt series in STEM mode, including both structural information and EDS information. This is only feasible because of the extremely efficient collection of x-rays through the use of the large-area dual detectors configured on this microscope. For more information, see Dr. Brian Van Devener, Dr. Randy Polson, or Dr. Paulo Perez.