We will be hosting an upcoming workshop on nano-electrical AFM characterization methods, focusing on Peak Force Kelvin Probe Force Microscopy (PF-KPFM).

This free workshop will run from 10 am to 5 pm on January 13th 2016 and will include lectures as well as demonstrations on the Dimension Icon instrument in the Surface Analysis Lab.

Date/Time: January 13th 10:00 am to 5:00 pm
Location: Sorenson Molecular Biotechnology Building (SMBB) room 2650 (lectures) and room 2142 (demonstrations)

To register, please go to
www.bruker.com/BNS-NA_workshops
and to schedule hands on time with the instrument, please contact
Drew.Griffin@bruker.com

For more details, please see the flyer.