- Clean PR off mask (if needed):
- Acetone
- IPA
- DI SRD
- O2 RIE 3min 100 W Technics Etcher
- DI SRD again (so PR doesn’t stick to mask in contact mode)
- Clean and Dehydrate Si Wafer immediately prior to spinning
- O2 plasma 200W
- 2 min
- Technics RIE Etcher
- Spin CEE 100 Spinner
- Use chuck that is slightly smaller than substrate
- Coat inside of spinner bowl with aluminum foil for easy cleanup after spinning
- HMDS 3000 rpm 30 sec
- nLOF 2020 3000rpm 60 sec
- Hot plate bake wafer 110C 1 min (Prebake)
- Suss Aligner
- Hard N2 contact
- 15 sec expose 7mW/cm^2 (~105 mJ/cm^2)
- Hot plate wafer post exposure bake (PEB)
- 110 C
- 2 min
- Develop 300MIF 3 minutes
- DI rinse 2 min, then place inside spin rinse drier (SRD)
- Microscope inspection and measurements
- Liftoff deposition
- Sputter
- Keep total film thickness less than 1/3 of photoresist height (PR ~2um, so film max ~670nm)
- Denton 80: keep power less than or equal to 50W
- Denton 635: keep power less than or equal to 100 W
- TMV: keep power less than or equal to 100 W
- E-gun: Keep temperature readout below 40C
- Liftoff in Lauda bath
- Heat Kwik strip to 80C
- Place wafer inside thin vertical wafer dipper and submerge in Kwik strip for >2 hours or until all nLOF photoresist is dissolved
- Isopropyl Alcohol (IPA) dip in IPA tank
- Ultrasonication in water if necessary (do not allow wafer to dry until all the film is lifted off)
- SRD